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Suggested Citation:"Appendix E: Acronyms and Abbreviations." National Research Council. 2001. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001. Washington, DC: The National Academies Press. doi: 10.17226/10204.
×

Appendix E Acronyms and Abbreviations


ADA—

American Dental Association

ADL—

architecture description language

AES—

Advanced Encryption Standard

AFM—

atomic force microscopy/microscope

AFST—

Advanced Fire Services Technologies

AML—

Advanced Measurement Laboratory

AMO—

atomic, molecular, and optical

AM&PM—

Advanced Measurement and Prediction Methods

ANSI—

American National Standards Institute

API—

application programming interface

ASME—

American Society of Mechanical Engineers

ASTM—

American Society for Testing and Materials

ATP—

Advanced Technology Program


BACnet—

Building Automation and Control Network

BEES—

Building for Environmental and Economic Sustainability

BFRL—

Building and Fire Research Laboratory

BIPM—

Bureau International des Poids et Mésures


CAD—

computer-aided design

CARB—

Center for Advanced Research in Biotechnology

CCCBDB—

Computational Chemistry Comparison and Benchmark Database

CCL—

Consultative Committee on Length

CCM—

Consultative Committee for Mass and Related Quantities

CCQM—

Consultative Committee for the Amount of Substance

CD—

critical dimension; compact disk

CHRNS—

Center for High Resolution Neutron Scattering

CIF—

common industry format

Suggested Citation:"Appendix E: Acronyms and Abbreviations." National Research Council. 2001. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001. Washington, DC: The National Academies Press. doi: 10.17226/10204.
×

CIO—

chief information officer

CIPM—

Comité International des Poids et Mésures

CIRMS—

Council on Ionizing Radiation Measurements and Standards

CISPR—

International Special Committee on Radio Interference

CMM—

coordinate measuring machine

CONTAM—

contaminant transport analysis computer program

CORM—

Council for Optical Radiation Measurements

CPC—

calcium phosphate cement

CPCC—

Ceramic Processing and Characterization Council

CPTWG—

Copyright Protection Technical Working Group

CRADA—

cooperative research and development agreement

CRM—

certified reference material

CSEAT—

Computer Security Expert Assist Team

CSTL—

Chemical Science and Technology Laboratory

CVD—

chemical vapor deposition


DARPA—

Defense Advanced Research Projects Agency

DASE—

digital TV application software environment

DC—

direct current

DCS—

disk chopper time-of-flight spectrometer

DLMF—

Digital Library of Mathematical Functions

DMATS—

Display Measurement Assessment Transfer Standard

DMIS—

dimensional measuring interface standard

DNA—

deoxyribonucleic acid

DOD—

Department of Defense

DOE—

Department of Energy

DOT—

Department of Transportation

DRM—

digital rights management

DRS—

diffuse reflectance spectrometer/spectrometry

DTV—

digital television

DVD—

digital versatile disk


EBIT—

electron-beam ion trap

EEEL—

Electronics and Electrical Engineering Laboratory

EM—

electromagnetic

EMC—

electromagnetic compatibility; Enhanced Machine Controller

EPA—

Environmental Protection Agency

EPR—

electron paramagnetic resonance

ESR—

electron spin resonance

EUV—

extreme ultraviolet


FANS—

filter analyzer neutron spectrometer

FASCAL—

Facility for Automatic Spectroradiometric Calibrations

FAST—

financial agent secure transactions

FCS—

Fermi chopper time-of-flight spectrometer

FDA—

Food and Drug Administration

FDD—

fault detection and diagnostics

FDS—

fire dynamics simulator

Suggested Citation:"Appendix E: Acronyms and Abbreviations." National Research Council. 2001. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001. Washington, DC: The National Academies Press. doi: 10.17226/10204.
×

FEMA—

Federal Emergency Management Agency

FERET—

face recognition technology

FIATECH—

fully integrated and automated technologies

FIB—

focused ion beam

FRP—

fiber-reinforced polymer

FTIR—

Fourier transform infrared


GaAs—

gallium arsenide

GAMS—

Guide to Available Mathematical Software

GEC—

Gaseous Electronics Conference

GMO—

genetically modified organism

GMR—

giant magnetoresistance

GPS—

Global Positioning System


HFBS—

high-flux backscattering spectrometer

HHI—

Healthy Homes Initiative

HPC—

high-performance concrete

HP-ICP-OES—

high performance-inductively coupled plasma-optical emission spectrometry

HTS—

high-temperature superconductor

HUD—

Department of Housing and Urban Development

HVAC—

heating, ventilation, and air-conditioning


IAEA—

International Atomic Energy Agency

IAV—

Industrial Autonomous Vehicles

IC—

integrated circuit

ICP—

inductively coupled plasma

IDEMA—

International Disk Drive Equipment and Materials Association

IEA—

International Energy Agency

IEC—

International Electrotechnical Commission

IEEE—

Institute of Electrical and Electronics Engineers

IETF—

Internet Engineering Task Force

IGBT—

insulated gate bipolar transistors

INAA—

instrumental neutron activation analysis

INO—

inhaled nitric oxide

IP—

Internet Protocol; intellectual property

IPsec—

Internet Protocol Security

IR—

infrared

ISO—

International Organization for Standardization

IT—

information technology

ITAP—

IT architecture plan

ITL—

Information Technology Laboratory

ITRS—

International Technology Roadmap for Semiconductors

ITSPT—

Information Technology Services Planning Team

IUPAC—

International Union for Pure and Applied Chemistry

IVI—

Intelligent Vehicle Initiative


JamPack—

Java matrix package

JEDEC—

Joint Electron Device Engineering Council

JPEG—

Joint Photographic Experts Group


MALDI—

matrix-assisted laser desorption ionization

Suggested Citation:"Appendix E: Acronyms and Abbreviations." National Research Council. 2001. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001. Washington, DC: The National Academies Press. doi: 10.17226/10204.
×

MANET—

mobile ad hoc network

MBE—

molecular beam epitaxy

MEL—

Manufacturing Engineering Laboratory

MEMS—

microelectromechanical systems

MERLiN—

modeling, evaluation, and research of lightwave networks

MMS—

Minerals Management Service

MPEC—

Motion Picture Experts Group

MPLS—

multiprotocol label switching

MRA—

Mutual Recognition Agreement

MRAM—

magnetic random access memory

MS—

mass spectrometry/spectrometer

MSEL—

Materials Science and Engineering Laboratory

MSL—

Measurement and Standards Laboratories


NAAQS—

National Ambient Air Quality Standards

NASA—

National Aeronautics and Space Administration

NCNR—

NIST Center for Neutron Research

NCSLI—

National Conference of Standards Laboratories International

NEI—

Nuclear Energy Institute

NFG—

nonfederal government (agencies)

NFPA—

National Fire Protection Association

NIAP—

National Information Assurance Partnership

NIH—

National Institutes of Health

NIJ—

National Institute of Justice

NIOF—

Neutron Interferometry and Optics Facility

NIST—

National Institute of Standards and Technology

NMI—

national measurement institute

NMR—

nuclear magnetic resonance

NOAA—

National Oceanic and Atmospheric Administration

NORAMET—

North American Metrology Organization

NRC—

National Research Council

NRS—

nanoscale recording system

NSE—

neutron spin echo

NSF—

National Science Foundation

NSIC—

National Storage Industry Consortium

NSMP—

National Semiconductor Metrology Program

NSOM—

near-field scanning optical microscopy/microscope

NSRL—

National Software Reference Laboratory

NTRM—

NIST-Traceable Reference Material


OA—

other agencies

OAE—

Office of Applied Economics

OASIS—

Organization for the Advancement of Structured Information Standards

OCAP—

OpenCable Application Program

OIDA—

Optoelectronics Industry Development Association

OLCI—

optical low-coherence interferometer

OLES—

Office of Law Enforcement Standards

OMP—

Office of Microelectronics Programs

Suggested Citation:"Appendix E: Acronyms and Abbreviations." National Research Council. 2001. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001. Washington, DC: The National Academies Press. doi: 10.17226/10204.
×

OOF—

object-oriented finite-element (analysis system)


PATH—

Partnership for Advancing Technologies in Housing

PCASYS—

pattern-level classification for automation system for fingerprints

PDB—

Protein Data Bank

pdf—

portable document format

PDM—

product data management

PKI—

public key infrastructure

PL—

Physics Laboratory

PM—

particulate matter

PMD—

polarization mode dispersion


QD—

quantum dot

QPD—

Quantum Physics Division


RCS—

real-time control systems

REFLEAK—

refrigerant mixture leakage behavior

REML—

RF-EM Field Metrology Laboratory

RF—

radio frequency

RIF—

reduction in force

RIMS—

resonance ionization mass spectrometry/spectrometer

RNA—

ribonucleic acid

RRF—

Reduced Risk of Flashover

RTP—

rapid thermal processing


SANS—

small-angle neutron scattering

SCM—

scanning capacitance microscopy/microscope

SDMI—

Secure Digital Music Initiative

SEM—

scanning electron microscopy/microscope

SEMATECH—

Semiconductor Manufacturing Technology Consortium

SEMPA—

scanning electron microscopy with polarization analysis

SET—

single-electron tunneling

SHMOKE—

second harmonic magneto-optic Kerr effect

SI—

International System (of units)

SIA—

Semiconductor Industry Association

SIM—

Sistema Interamericano Metrología

SIP—

session initiation protocol

SIRCUS—

spectral irradiance and radiance calibration with uniform sources

SIS—

superconductor-insulator-superconductor

SQUID—

superconducting quantum interference device

SRAM—

static random access memory

SRD—

Standard Reference Database

SRM—

Standard Reference Material

STEP—

standard(s) for the exchange of product model data

STM—

scanning tunneling microscopy/microscope

STR—

short tandem repeat

STRS—

Scientific and Technical Research and Services

SURF—

Synchrotron Ultraviolet Radiation Facility


TBC—

thermal barrier coating

TEM—

transmission electron microscopy/microscope

Suggested Citation:"Appendix E: Acronyms and Abbreviations." National Research Council. 2001. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001. Washington, DC: The National Academies Press. doi: 10.17226/10204.
×

TIA—

Telecommunications Industries Association

TIMS—

thermal ionization mass spectrometry/spectrometer

TOF—

time of flight

TRC—

Thermodynamics Research Center

TREC—

Text Retrieval Conference


UCN—

ultracold neutron

ULSI—

ultralarge-scale integration

USFA—

U.S. Fire Administration

UTC—

coordinated universal time

UTM—

universal testing machine


UV—

ultraviolet

UWB—

ultrawideband

VCBT—

virtual cybernetic building testbed

VCCTL—

virtual cement and concrete testing laboratory


WDM—

wavelength division multiplexing


XML—

extensible markup language

Suggested Citation:"Appendix E: Acronyms and Abbreviations." National Research Council. 2001. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001. Washington, DC: The National Academies Press. doi: 10.17226/10204.
×
Page 303
Suggested Citation:"Appendix E: Acronyms and Abbreviations." National Research Council. 2001. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001. Washington, DC: The National Academies Press. doi: 10.17226/10204.
×
Page 304
Suggested Citation:"Appendix E: Acronyms and Abbreviations." National Research Council. 2001. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001. Washington, DC: The National Academies Press. doi: 10.17226/10204.
×
Page 305
Suggested Citation:"Appendix E: Acronyms and Abbreviations." National Research Council. 2001. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001. Washington, DC: The National Academies Press. doi: 10.17226/10204.
×
Page 306
Suggested Citation:"Appendix E: Acronyms and Abbreviations." National Research Council. 2001. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001. Washington, DC: The National Academies Press. doi: 10.17226/10204.
×
Page 307
Suggested Citation:"Appendix E: Acronyms and Abbreviations." National Research Council. 2001. An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001. Washington, DC: The National Academies Press. doi: 10.17226/10204.
×
Page 308
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 An Assessment of the National Institute of Standards and Technology Measurement and Standards Laboratories: Fiscal Year 2001
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This volume represents the 42nd annual assessment by the National Research Council (NRC) of the technical quality and relevance of the programs of the Measurement and Standards Laboratories of the National Institute of Standards and Technology (NIST). This report provides judgments regarding the overall state of the NIST Measurement and Standards Laboratories (MSL),and offers findings to further increase the merit and impact of NIST MSL programs. It also offers in-depth reviews of each of the seven laboratories of the MSL, with findings aimed at their specific programmatic areas.

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