C
Acronyms
ADC | analog-to-digital converter |
APL | approach, proximity, and landing |
ASIC | application-specific integrated circuit |
AU | astronomical unit |
CAD | computer-aided design |
CCD | charge-coupled device |
CME | coronal mass ejection |
CMOS | complementary metal–oxide–semiconductor |
CMUXE | Center for Materials Under Extreme Environments |
COTS | commercial off the shelf |
CRADA | Cooperative Research and Development Agreement |
DAC | digital-to-analog converter |
DC | direct current |
DDD | displacement damage dose |
DOD | Department of Defense |
DOE | Department of Energy |
DRAM | dynamic random-access memory |
DSEE | destructive single-event effect |
ESA | European Space Agency |
ESD | electrostatic discharge |
ESP | Emission of Solar Protons |
FDIR | fault detection, isolation, and recovery |
FOM | figure of merit |
FPGA | field-programmable gate array |
FRIB | Facility for Rare Ion Beams |
FY | fiscal year |
GCR | galactic cosmic rays |
GEO | geostationary orbit |
GeV | gigaelectionvolt |
GNC | guidance, navigation, and control |
HA | hardness assurance |
HZE | high (H) atomic number (Z) and energy (E) |
IEEE | Institute of Electrical and Electronics Engineers |
IoT | Internet of Things |
ISS | International Space Station |
IUCF | Indiana University Cyclotron Facility |
JPL | Jet Propulsion Laboratory |
LANL | Los Alamos National Laboratory |
LBNL | Lawrence Berkeley National Laboratory |
LED | light-emitting diode |
LEO | low Earth orbit |
LET | linear energy transfer |
M&O | microelectronic and optoelectronic |
M&S | modeling and simulation |
MBMA | Model-Based Mission Assurance |
MBSE | Model-Based Systems Engineering |
MBU | multi-bit upset |
MC | Monte Carlo |
MCU | multi-cell upset |
MeV | million electron volts |
MIBL | Michigan Ion Beam Laboratory |
MIT | Massachusetts Institute of Technology |
MMOD | micrometeoroids and orbital debris |
MOOC | massive open online course |
MOSFET | metal-oxide-semiconductor field-effect transistor |
MRED | Monte Carlo Radiative Energy Deposition |
NASA | National Aeronautics and Space Administration |
NEPP | NASA Electronic Parts and Packaging |
NRL | Naval Research Laboratory |
NSCL | National Superconducting Cyclotron Laboratory |
NSREC | Nuclear and Space Radiation Effects Conference |
NSRL | NASA Space Radiation Laboratory |
NSRSS | NASA Space Radiation Summer School |
ORSORT | Oak Ridge School of Reactor Technology |
PSYCHIC | Prediction of Solar Particle Yields for Characterizing Integrated Circuits |
RADECS | Radiation and its Effects on Components and Systems |
RF | radio frequency |
RPP | rectangular parallelepiped |
SDRAM | synchronous dynamic random-access memory |
SEB | single-event burnout |
SEE | single-event effect |
SEFI | single-event functional interrupt |
SEGR | single-event gate rupture |
SEL | single-event latchup |
SEP | solar energetic particle |
SET | single-event transient |
SEU | single-event upset |
SEUTF | Brookhaven SEU Test Facility |
SMD | standard microcircuit drawing |
SOA | safe operating area |
SPE | solar particle event |
SRAM | static random-access memory |
TAMU | Texas A&M University |
TID | total ionizing dose |
UC | University of California |