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Memorial Tributes Volume 16 (2012) / Chapter Skim
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AL F. TASH, JR.
Pages 320-325

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From page 321...
... His thesis research in impurities in silicon was the pioneering work that led to the widely known deep-level transient spectroscopy for characterizing impurities in semiconductors, which is still used today worldwide. In 1969 he joined Texas Instruments, performing research that resulted in the first demonstration of a metalinsulator-semiconductor structure in mercury cadmium telluride, and he helped lay the foundation for infrared detector development and products throughout the 1970s and 1980s.
From page 322...
... In 1978, Al was honored as a Texas Instruments fellow for his contributions to charge coupled devices and MOS dynamic memory technology. He was appointed associate director of the Very Large Scale Integration (VLSI)
From page 323...
... Al initiated a research program with his students in MOS device modeling and analysis that is recognized worldwide. Since starting at UT Austin, Al worked with the new faculty members as a mentor and collaborator to assist them in developing their graduate education and research programs.
From page 324...
... ; the Semiconductor Research Corporation Technical Excellence Award (1992) ; the Billy and Claude Hocott Distinguished Centennial Engineering Research Award (1995)
From page 325...
... Ta s c h , J r . 325 Al is survived by his wife Judith; his son Edward and wife Anne; his son David and wife Sara and their children, Carsten and Kelsey; and his sister, Mary Jo Snider.


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