Skip to main content

Currently Skimming:

APPENDIX C: ABRIDGED STATEMENT OF WORK
Pages 258-258

The Chapter Skim interface presents what we've algorithmically identified as the most significant single chunk of text within every page in the chapter.
Select key terms on the right to highlight them within pages of the chapter.


From page 258...
... Assist NIST in examining emerging technologies expected to require research in metrology and in order to keep abreast of its mission and additional legislative assignments. Such areas include process and quality control, technology transfer, engineering databases, high-performance composites, advanced ceramics, fiber optics, microwave metrology, bioprocess engineering, and advanced computing concepts.


This material may be derived from roughly machine-read images, and so is provided only to facilitate research.
More information on Chapter Skim is available.